

an open source ImageJ plugin suite for super-resolution structured illumination microscopy data quality control
Quality control
DeltaVision OMX, Zeiss Elyra, Nikon N-SIM data format compatibility
Raw data intensity profile (bleaching, angle variation, intensity fluctuation)
Raw data Fourier analysis to assess illumination quality
Motion blur and angle illumination variation
Modulation contrast map & average modulation-contrast-to-noise ratio
Reconstructed data histogram analysis
Spherical aberration mismatch between sample and reconstruction OTF
XY and Z Fourier analysis to identify reconstruction artifacts and asses frequency support vs. effective resolution
Identification of noise reconstruction artifacts and saturated pixel
Log-file with results & interpretation guidelines
Summary statistics table
Online help
Axial modulation pattern focus (top-phase calibration)
Phase stepping analysis
Synchronous xyz-cropping of raw and reconstructed datasets
Format converter (Zeiss Elyra / Nikon N-SIM)
Pseudo-widefield image generation
Auto-threshold & 16-bit composite TIF converter
Stack FFT (variable options)
Download PDF of print version plus revised supplementary material here
For further information contact: g.ball@dundee.ac.uk / lothar.schermelleh@bioch.ox.ac.uk
SIMCheck documentation and manual here
SIMCheck code on GitHub here