an open source ImageJ plugin suite for super-resolution structured illumination microscopy data quality control
Quality control
DeltaVision OMX, Zeiss Elyra, Nikon N-SIM data format compatibility - Raw data intensity profile (bleaching, angle variation, intensity fluctuation)
- Raw data Fourier analysis to assess illumination quality
- Motion blur and angle illumination variation
- Modulation contrast map & average modulation-contrast-to-noise ratio
- Reconstructed data histogram analysis
- Spherical aberration mismatch between sample and reconstruction OTF
- XY and Z Fourier analysis to identify reconstruction artifacts and asses frequency support vs. effective resolution
- Identification of noise reconstruction artifacts and saturated pixel
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Log-file with results & interpretation guidelines
- Summary statistics table
- Online help
- Axial modulation pattern focus (top-phase calibration)
- Phase stepping analysis
- Synchronous xyz-cropping of raw and reconstructed datasets
- Format converter (Zeiss Elyra / Nikon N-SIM)
- Pseudo-widefield image generation
- Auto-threshold & 16-bit composite TIF converter
- Stack FFT (variable options)
Download PDF of print version plus revised supplementary material here
For further information contact: g.ball@dundee.ac.uk / lothar.schermelleh@bioch.ox.ac.uk
SIMCheck documentation and manual here
SIMCheck code on GitHub here